SUSTech team makes research progress in the field of Device Reliability
The team led by Associate Professor Yury Illarionov from the Department of Materials Science and Engineering at Southern University of Science and Technology (SUSTech) conducted in-depth research on dual-gate ITO/HfO2 field-effect transistor systems. Through systematic reliability analysis (including universal hysteresis mapping, bias temperature instability testing, and TCAD simulations), they revealed for the first time that […]
2026-04-22|Research